Maximal Frequent Sequence Based Test Suite Reduction through DU-pairs
Volume 2, Issue 1 (2014), pp. 276–288
Pub. online: 26 August 2014
Type: Article
Open Access
Received
13 May 2014
13 May 2014
Accepted
27 June 2014
27 June 2014
Published
26 August 2014
26 August 2014
Abstract
The current paper illustrates the importance of clustering the frequent items of code coverage during test suite reduction. A modular Most maximal frequent sequence clustered algorithm has been used along with a Requirement residue based test case reduction process. DU-pairs form the basic code coverage requirement under consideration for test suite reduction. This algorithm farewell when compared with few other algorithms like Harrold Gupta and Soffa (HGS) and Bi-Objective Greedy (BOG) algorithms and Greedy algorithms in covering all the DU-Pairs. The coverage criteria achieved is 100% in many cases, except for few insufficient and incomplete test suites.