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  <front>
    <journal-meta>
      <journal-id journal-id-type="publisher-id">csat</journal-id>
      <journal-title-group>
        <journal-title>Computational Science and Techniques</journal-title>
      </journal-title-group>
      <issn pub-type="epub"/>
      <issn pub-type="ppub"/>
      <publisher>
        <publisher-name>KU</publisher-name>
      </publisher>
    </journal-meta>
    <article-meta>
      <article-id pub-id-type="publisher-id">396_3134_1_PB</article-id>
      <article-id pub-id-type="doi">10.15181/csat.v2i1.396</article-id>
      <article-categories>
        <subj-group subj-group-type="heading">
          <subject>Article</subject>
        </subj-group>
      </article-categories>
      <title-group>
        <article-title>Maximal Frequent Sequence Based Test Suite Reduction through DU-pairs</article-title>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <name>
            <surname>Bangole</surname>
            <given-names>Narendra Kumar Rao</given-names>
          </name>
          <email xlink:href="mailto:narendrakumarrao@yahoo.com">narendrakumarrao@yahoo.com</email>
          <xref ref-type="aff" rid="j_csat_aff_000"/>
          <xref ref-type="corresp" rid="cor1">∗</xref>
        </contrib>
        <aff id="j_csat_aff_000">JNTU College of Engineering, JNTUH, Hyderabad, India</aff>
        <contrib contrib-type="author">
          <name>
            <surname>Ambati</surname>
            <given-names>RamaMohan Reddy</given-names>
          </name>
          <xref ref-type="aff" rid="j_csat_aff_001"/>
        </contrib>
        <aff id="j_csat_aff_001">SV University College of Engineering, Tirupati, India</aff>
      </contrib-group>
      <author-notes>
        <corresp id="cor1"><label>∗</label>Corresponding author.</corresp>
      </author-notes>
      <volume>2</volume>
      <issue>1</issue>
      <fpage>276</fpage>
      <lpage>288</lpage>
      <pub-date pub-type="epub">
        <day>26</day>
        <month>08</month>
        <year>2014</year>
      </pub-date>
      <history>
        <date date-type="received">
          <day>13</day>
          <month>05</month>
          <year>2014</year>
        </date>
        <date date-type="accepted">
          <day>27</day>
          <month>06</month>
          <year>2014</year>
        </date>
      </history>
      <permissions>
        <copyright-year>2014</copyright-year>
        <license license-type="open-access" xlink:href="http://creativecommons.org/licenses/by/3.0/">
          <license-p>Creative Commons Attribution 3.0 License</license-p>
        </license>
      </permissions>
      <abstract>
        <p>The current paper illustrates the importance of clustering the frequent items of code coverage during test suite reduction. A modular Most maximal frequent sequence clustered algorithm has been used along with a Requirement residue based test case reduction process. DU-pairs form the basic code coverage requirement under consideration for test suite reduction. This algorithm farewell when compared with few other algorithms like Harrold Gupta and Soffa (HGS) and Bi-Objective Greedy (BOG) algorithms and Greedy algorithms in covering all the DU-Pairs. The coverage criteria achieved is 100% in many cases, except for few insufficient and incomplete test suites.</p>
      </abstract>
      <kwd-group>
        <label>Keywords</label>
        <kwd>software testing</kwd>
        <kwd>test case</kwd>
        <kwd>code coverage criteria</kwd>
        <kwd>test suite</kwd>
        <kwd>test suite reduction</kwd>
      </kwd-group>
    </article-meta>
  </front>
</article>
